NU-523XX - INV-0011 - How, Hoton, et al. - "Methods and Apparatus of Detecting Structural / Electronic Flaws in Microprocessor Chips", 2000
File — Box: 19
Dates
- Creation: 2000
Creator
- From the Collection: Northeastern University (Boston, Mass.). Office of Technology Innovation and Commercialization (Organization)
Language of Materials
From the Collection:
The collection is entirely in English.
Conditions Governing Access:
None.
Extent
From the Collection: 23 cubic feet (23 containers)
Repository Details
Part of the Northeastern University Archives and Special Collections Repository